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Multi-Chip Module Test Strategies

af Yervant Zorian

indgår i Frontiers in Electronic Testing serien

Multi-Chip Module Test Strategies af Yervant Zorian
Bag om Multi-Chip Module Test Strategies

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780792399209
  • Indbinding:
  • Hardback
  • Sideantal:
  • 168
  • Udgivet:
  • 31. Maj 1997
  • Størrelse:
  • 183x14x260 mm.
  • Vægt:
  • 525 g.
  • 8-11 hverdage.
  • 5. Oktober 2024
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Beskrivelse af Multi-Chip Module Test Strategies

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.
Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain.
Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).

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