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Introduction to Advanced System-on-Chip Test Design and Optimization

af Erik Larsson

indgår i Frontiers in Electronic Testing serien

Introduction to Advanced System-on-Chip Test Design and Optimization af Erik Larsson
Bag om Introduction to Advanced System-on-Chip Test Design and Optimization

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781441952691
  • Indbinding:
  • Paperback
  • Sideantal:
  • 388
  • Udgivet:
  • 28. Oktober 2010
  • Udgave:
  • 12005
  • Vægt:
  • 639 g.
  • 8-11 hverdage.
  • 5. Oktober 2024
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SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.

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