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Theoretical Concepts of X-Ray Nanoscale Analysis

- Theory and Applications

af Ilya Feranchuk, Alexander Ulyanenkov, Andrei Benediktovich

indgår i Springer Series in Materials Science serien

Theoretical Concepts of X-Ray Nanoscale Analysis af Ilya Feranchuk
Bag om Theoretical Concepts of X-Ray Nanoscale Analysis

The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783642381768
  • Indbinding:
  • Hardback
  • Sideantal:
  • 318
  • Udgivet:
  • 7. september 2013
  • Udgave:
  • 2014
  • Størrelse:
  • 235x155x23 mm.
  • Vægt:
  • 664 g.
  • 8-11 hverdage.
  • 16. december 2024
Forlænget returret til d. 31. januar 2025

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- Ingen binding

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Ingen binding og kan opsiges når som helst.

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The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis.

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