Analog IC Reliability in Nanometer CMOS
- Indbinding:
- Hardback
- Sideantal:
- 198
- Udgivet:
- 9. januar 2013
- Udgave:
- 2013
- Størrelse:
- 243x160x17 mm.
- Vægt:
- 454 g.
Leveringstid:
8-11 hverdage
Forventet levering: 27. november 2024
Beskrivelse af Analog IC Reliability in Nanometer CMOS
This book focuses on modeling, simulation and analysis of analog circuit aging. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared.
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