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X-ray Scattering From Semiconductors (2nd Edition)

af Paul F (Panalytical Research Fewster
X-ray Scattering From Semiconductors (2nd Edition) af Paul F (Panalytical Research Fewster
Bag om X-ray Scattering From Semiconductors (2nd Edition)

A practical guide to the analysis of materials, including a description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781860943607
  • Indbinding:
  • Hardback
  • Sideantal:
  • 316
  • Udgivet:
  • 8. juli 2003
  • Udgave:
  • 2
  • Størrelse:
  • 230x154x24 mm.
  • Ukendt - mangler pt..
Forlænget returret til d. 31. januar 2025

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Beskrivelse af X-ray Scattering From Semiconductors (2nd Edition)

A practical guide to the analysis of materials, including a description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general.

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