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X-Ray Absorption Spectroscopy of Semiconductors

indgår i Springer Series in Optical Sciences serien

X-Ray Absorption Spectroscopy of Semiconductors
Bag om X-Ray Absorption Spectroscopy of Semiconductors

Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783662522127
  • Indbinding:
  • Paperback
  • Sideantal:
  • 361
  • Udgivet:
  • 23. august 2016
  • Udgave:
  • 12015
  • Størrelse:
  • 235x155x20 mm.
  • Vægt:
  • 5737 g.
  • 8-11 hverdage.
  • 17. januar 2025

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Beskrivelse af X-Ray Absorption Spectroscopy of Semiconductors

Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

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