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Testing and Reliable Design of CMOS Circuits

af Niraj K. Jha, Sandip Kundu

indgår i The Springer International Series in Engineering and Computer Science serien

Testing and Reliable Design of CMOS Circuits af Niraj K. Jha
Bag om Testing and Reliable Design of CMOS Circuits

In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. However, the rapid advance ments in this area pose many new problems in the area of testing. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781461288183
  • Indbinding:
  • Paperback
  • Sideantal:
  • 232
  • Udgivet:
  • 26. september 2011
  • Udgave:
  • 11990
  • Størrelse:
  • 235x155x13 mm.
  • Vægt:
  • 385 g.
  • 8-11 hverdage.
  • 20. november 2024

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In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. However, the rapid advance ments in this area pose many new problems in the area of testing. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing.

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