Name: Temperature Measurement during Millisecond Annealing
Price: 662.95 DKK
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Author: Denise Reichel
ISBN: 9783658113872

Temperature Measurement during Millisecond Annealing af Denise Reichel

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Paperback
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662,95 kr.

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Denise Reichel studies the delicate subject of temperature measurement during lamp-based annealing of semiconductors, in particular during flash lamp annealing. The approach of background-correction using amplitude-modulated light to obtain the sample reflectivity is reinvented from rapid thermal annealing to apply to millisecond annealing.

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Sprog:
Engelsk

ISBN:
9783658113872

Forlag:
Springer

Indbinding:
Paperback

Sideantal:
112

Udgivet:
8. januar 2016

Udgave:
12015

Størrelse:
210x148x8 mm.

Vægt:
1906 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 11. december 2024

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Forlænget returret til d. 31. januar 2025

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Denise Reichel studies the delicate subject of temperature measurement during lamp-based annealing of semiconductors, in particular during flash lamp annealing. The approach of background-correction using amplitude-modulated light to obtain the sample reflectivity is reinvented from rapid thermal annealing to apply to millisecond annealing.

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