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  5. Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

- Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002

indgår i NATO Science Series II serien

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Bag om Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781402030178
  • Indbinding:
  • Hardback
  • Sideantal:
  • 488
  • Udgivet:
  • 2. marts 2005
  • Udgave:
  • 2005
  • Størrelse:
  • 232x156x28 mm.
  • Vægt:
  • 2010 g.
  • 8-11 hverdage.
  • 12. februar 2025

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Beskrivelse af Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.

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