Name: Scanning Electron Microscopy and X-Ray Microanalysis
Price: 1248.95 DKK
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Author: Patrick Echlin
ISBN: 9781461349693

Scanning Electron Microscopy and X-Ray Microanalysis af Patrick Echlin

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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

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Sprog:
Engelsk

ISBN:
9781461349693

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Paperback

Sideantal:
689

Udgivet:
31. maj 2013

Udgave:
320033

Størrelse:
182x255x43 mm.

Vægt:
1310 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 6. december 2024

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1.248,95 kr. + Fragt
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1.243,95 kr.

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Abonnementet koster 75 kr./md.
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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

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