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Scanning Electron Microscopy and X-Ray Microanalysis

- Third Edition

af Joseph Goldstein
Scanning Electron Microscopy and X-Ray Microanalysis af Joseph Goldstein
Bag om Scanning Electron Microscopy and X-Ray Microanalysis

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780306472923
  • Indbinding:
  • Hardback
  • Sideantal:
  • 689
  • Udgivet:
  • 31. januar 2003
  • Udgave:
  • 32003
  • Størrelse:
  • 178x255x38 mm.
  • Vægt:
  • 1684 g.
  • Ukendt - mangler pt..

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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

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