De Aller-Bedste Bøger - over 12 mio. danske og engelske bøger
Levering: 1 - 2 hverdage
Hjælp
Login
  1. Forside
  2. Bøger
  3. Business og læring
  4. Computer og IT
  5. Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies

af Alvin W. (IBM) Strong

indgår i IEEE Press Series on Microelectronic Systems serien

Reliability Wearout Mechanisms in Advanced CMOS Technologies af Alvin W. (IBM) Strong
Bag om Reliability Wearout Mechanisms in Advanced CMOS Technologies

This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9780471731726
  • Indbinding:
  • Hardback
  • Sideantal:
  • 640
  • Udgivet:
  • 4. september 2009
  • Størrelse:
  • 164x243x34 mm.
  • Vægt:
  • 993 g.
  • 2-3 uger.
  • 29. januar 2025

Normalpris

Abonnementspris

- Rabat på køb af fysiske bøger
- 1 valgfrit digitalt ugeblad
- 20 timers lytning og læsning
- Adgang til 70.000+ titler
- Ingen binding

Abonnementet koster 75 kr./md.
Ingen binding og kan opsiges når som helst.

Bag om Alvin W. (IBM) Strong

Vis alle bøger af Alvin W. (IBM) Strong

Beskrivelse af Reliability Wearout Mechanisms in Advanced CMOS Technologies

This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

Brugerbedømmelser af Reliability Wearout Mechanisms in Advanced CMOS Technologies



Andre købte også..
Find lignende bøger
Bogen Reliability Wearout Mechanisms in Advanced CMOS Technologies findes i følgende kategorier: