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Radiation-induced Soft Error

- A Chip-level Modeling

af Norbert Seifert

indgår i Foundations and Trends (R) in Electronic Design Automation serien

Radiation-induced Soft Error af Norbert Seifert
Bag om Radiation-induced Soft Error

A simulation-based methodology of chip-level radiation-induced soft error rates that is fast and reasonably accurate is crucial to the reliability and success of a final product. This book summarises selected publications that are deemed relevant by the author to enable a truly chip-level radiation-induced soft error rate estimation methodology.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781601983947
  • Indbinding:
  • Paperback
  • Sideantal:
  • 136
  • Udgivet:
  • 27. november 2010
  • Størrelse:
  • 157x234x8 mm.
  • Vægt:
  • 210 g.
  • 8-11 hverdage.
  • 16. januar 2025

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A simulation-based methodology of chip-level radiation-induced soft error rates that is fast and reasonably accurate is crucial to the reliability and success of a final product. This book summarises selected publications that are deemed relevant by the author to enable a truly chip-level radiation-induced soft error rate estimation methodology.

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