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Quantitative Data Processing in Scanning Probe Microscopy

- SPM Applications for Nanometrology

Bag om Quantitative Data Processing in Scanning Probe Microscopy

Provides readers with a number of worked examples to demonstrate typical ways of solving problems in Scanning Probe Microscopy (SPM) analysis. This title uses the advanced research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781455730582
  • Indbinding:
  • Hardback
  • Sideantal:
  • 336
  • Udgivet:
  • 19. november 2012
  • Størrelse:
  • 191x235x25 mm.
  • Vægt:
  • 800 g.
  • 2-3 uger.
  • 19. december 2024
Forlænget returret til d. 31. januar 2025

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Provides readers with a number of worked examples to demonstrate typical ways of solving problems in Scanning Probe Microscopy (SPM) analysis. This title uses the advanced research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences.

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