De Aller-Bedste Bøger - over 12 mio. danske og engelske bøger
Levering: 1 - 2 hverdage
Hjælp
Login
  1. Forside
  2. Bøger
  3. Business og læring
  4. Power-Constrained Testing of VLSI Circuits

Power-Constrained Testing of VLSI Circuits

- A Guide to the IEEE 1149.4 Test Standard

af Nicola Nicolici, Bashir M. Al-Hashimi

indgår i Frontiers in Electronic Testing serien

Power-Constrained Testing of VLSI Circuits af Nicola Nicolici
Bag om Power-Constrained Testing of VLSI Circuits

This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9781402072352
  • Indbinding:
  • Hardback
  • Sideantal:
  • 178
  • Udgivet:
  • 28. Februar 2003
  • Udgave:
  • 2003
  • Størrelse:
  • 297x210x12 mm.
  • Vægt:
  • 990 g.
Leveringstid: 8-11 hverdage
Forventet levering: 5. Oktober 2024

Bag om Nicola Nicolici

Vis alle bøger af Nicola Nicolici

Beskrivelse af Power-Constrained Testing of VLSI Circuits

This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

Brugerbedømmelser af Power-Constrained Testing of VLSI Circuits



Andre købte også..
Find lignende bøger
Bogen Power-Constrained Testing of VLSI Circuits findes i følgende kategorier: