Power-Constrained Testing of VLSI Circuits
- A Guide to the IEEE 1149.4 Test Standard
- Indbinding:
- Hardback
- Sideantal:
- 178
- Udgivet:
- 28. februar 2003
- Udgave:
- 2003
- Størrelse:
- 297x210x12 mm.
- Vægt:
- 990 g.
Leveringstid:
8-11 hverdage
Forventet levering: 20. november 2024
Beskrivelse af Power-Constrained Testing of VLSI Circuits
This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
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