De Aller-Bedste Bøger - over 12 mio. danske og engelske bøger
Levering: 1 - 2 hverdage

Power-Constrained Testing of VLSI Circuits

- A Guide to the IEEE 1149.4 Test Standard

Bag om Power-Constrained Testing of VLSI Circuits

This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9781402072352
  • Indbinding:
  • Hardback
  • Sideantal:
  • 178
  • Udgivet:
  • 28. februar 2003
  • Udgave:
  • 2003
  • Størrelse:
  • 297x210x12 mm.
  • Vægt:
  • 990 g.
  • 8-11 hverdage.
  • 6. december 2024
På lager

Normalpris

Abonnementspris

- Rabat på køb af fysiske bøger
- 1 valgfrit digitalt ugeblad
- 20 timers lytning og læsning
- Adgang til 70.000+ titler
- Ingen binding

Abonnementet koster 75 kr./md.
Ingen binding og kan opsiges når som helst.

Beskrivelse af Power-Constrained Testing of VLSI Circuits

This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

Brugerbedømmelser af Power-Constrained Testing of VLSI Circuits



Find lignende bøger
Bogen Power-Constrained Testing of VLSI Circuits findes i følgende kategorier: