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Microscopy of Semiconducting Materials 2007

- Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK

Bag om Microscopy of Semiconducting Materials 2007

In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781402086144
  • Indbinding:
  • Hardback
  • Sideantal:
  • 498
  • Udgivet:
  • 18. september 2008
  • Udgave:
  • 2008
  • Størrelse:
  • 235x155x25 mm.
  • 8-11 hverdage.
  • 20. november 2024
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Beskrivelse af Microscopy of Semiconducting Materials 2007

In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes.

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