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Mathematical Challenges in Electron Microscopy

- Volume 232

Bag om Mathematical Challenges in Electron Microscopy

Mathematical Challenges in Electron Microscopy, Volume 232 of Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters. Each chapter is written by an international board of authors.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780443297861
  • Indbinding:
  • Hardback
  • Udgivet:
  • 25. november 2024
  • Ukendt - mangler pt..
  • 25. november 2024

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- Adgang til 70.000+ titler
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Mathematical Challenges in Electron Microscopy, Volume 232 of Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters. Each chapter is written by an international board of authors.

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