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  5. Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

af Sarah Fearn

indgår i IOP Concise Physics serien

Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science af Sarah Fearn
Bag om Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781681740249
  • Indbinding:
  • Paperback
  • Sideantal:
  • 66
  • Udgivet:
  • 16. oktober 2015
  • Størrelse:
  • 256x177x8 mm.
  • Vægt:
  • 192 g.
  • 2-3 uger.
  • 14. december 2024
Forlænget returret til d. 31. januar 2025

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Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

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