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Integrated Circuit Defect-Sensitivity: Theory and Computational Models

af José Pineda de Gyvez

indgår i The Springer International Series in Engineering and Computer Science serien

Integrated Circuit Defect-Sensitivity: Theory and Computational Models af José Pineda de Gyvez
Bag om Integrated Circuit Defect-Sensitivity: Theory and Computational Models

The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781461363835
  • Indbinding:
  • Paperback
  • Sideantal:
  • 167
  • Udgivet:
  • 23. februar 2014
  • Udgave:
  • 11993
  • Størrelse:
  • 235x155x11 mm.
  • Vægt:
  • 308 g.
  • 8-11 hverdage.
  • 10. december 2024
Forlænget returret til d. 31. januar 2025

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The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).

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