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Identification of Defects in Semiconductors

Bag om Identification of Defects in Semiconductors

Since its inception in 1966, the series of numbered volumes known as "Semiconductors and Semimetals" has distinguished itself through the selection of authors, editors, and contributors. Reflecting the interdisciplinary nature of the field that the series covers, these volumes are aimed at physicists, chemists, materials scientists, and others.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780127521596
  • Indbinding:
  • Hardback
  • Sideantal:
  • 376
  • Udgivet:
  • 2. juli 1998
  • Størrelse:
  • 152x229x25 mm.
  • Vægt:
  • 800 g.
  • 2-3 uger.
  • 11. december 2024

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Beskrivelse af Identification of Defects in Semiconductors

Since its inception in 1966, the series of numbered volumes known as "Semiconductors and Semimetals" has distinguished itself through the selection of authors, editors, and contributors. Reflecting the interdisciplinary nature of the field that the series covers, these volumes are aimed at physicists, chemists, materials scientists, and others.

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