Hot-Carrier Reliability of MOS VLSI Circuits
- Indbinding:
- Hardback
- Sideantal:
- 212
- Udgivet:
- 2. juni 1993
- Udgave:
- 1993
- Størrelse:
- 234x156x14 mm.
- Vægt:
- 1130 g.
Leveringstid:
8-11 hverdage
Forventet levering: 21. november 2024
Beskrivelse af Hot-Carrier Reliability of MOS VLSI Circuits
The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits.
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