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Hot-Carrier Reliability of MOS VLSI Circuits

af Yusuf Leblebici, Sung-Mo (Steve) Kang

indgår i The Springer International Series in Engineering and Computer Science serien

Hot-Carrier Reliability of MOS VLSI Circuits af Yusuf Leblebici
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The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780792393528
  • Indbinding:
  • Hardback
  • Sideantal:
  • 212
  • Udgivet:
  • 2. juni 1993
  • Udgave:
  • 1993
  • Størrelse:
  • 234x156x14 mm.
  • Vægt:
  • 1130 g.
  • 8-11 hverdage.
  • 7. december 2024

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The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits.

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