De Aller-Bedste Bøger - over 12 mio. danske og engelske bøger
Levering: 1 - 2 hverdage
Bag om Hot-Carrier Reliability of MOS VLSI Circuits

The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9780792393528
  • Indbinding:
  • Hardback
  • Sideantal:
  • 212
  • Udgivet:
  • 2. juni 1993
  • Udgave:
  • 1993
  • Størrelse:
  • 234x156x14 mm.
  • Vægt:
  • 1130 g.
Leveringstid: 8-11 hverdage
Forventet levering: 26. november 2024

Beskrivelse af Hot-Carrier Reliability of MOS VLSI Circuits

The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits.

Brugerbedømmelser af Hot-Carrier Reliability of MOS VLSI Circuits



Find lignende bøger
Bogen Hot-Carrier Reliability of MOS VLSI Circuits findes i følgende kategorier: