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Fundamentals of Electromigration-Aware Integrated Circuit Design

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The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783319735573
  • Indbinding:
  • Hardback
  • Sideantal:
  • 159
  • Udgivet:
  • 7. marts 2018
  • Udgave:
  • 12018
  • Størrelse:
  • 241x166x12 mm.
  • Vægt:
  • 434 g.
  • 8-11 hverdage.
  • 9. december 2024
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The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.

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