De Aller-Bedste Bøger - over 12 mio. danske og engelske bøger
Levering: 1 - 2 hverdage
Hjælp
Login
  1. Forside
  2. Bøger
  3. Business og læring
  4. Computer og IT
  5. From Contamination to Defects, Faults and Yield Loss

From Contamination to Defects, Faults and Yield Loss

- Simulation and Applications

af Jitendra B. Khare, Wojciech Maly

indgår i Frontiers in Electronic Testing serien

From Contamination to Defects, Faults and Yield Loss af Jitendra B. Khare
Bag om From Contamination to Defects, Faults and Yield Loss

Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9781461285953
  • Indbinding:
  • Paperback
  • Sideantal:
  • 150
  • Udgivet:
  • 26. september 2011
  • Udgave:
  • 11996
  • Størrelse:
  • 234x156x9 mm.
  • Vægt:
  • 272 g.
  • 8-11 hverdage.
  • 27. november 2024
På lager

Normalpris

Abonnementspris

- Rabat på køb af fysiske bøger
- 1 valgfrit digitalt ugeblad
- 20 timers lytning og læsning
- Adgang til 70.000+ titler
- Ingen binding

Abonnementet koster 75 kr./md.
Ingen binding og kan opsiges når som helst.

Bag om Jitendra B. Khare

Vis alle bøger af Jitendra B. Khare

Beskrivelse af From Contamination to Defects, Faults and Yield Loss

Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

Brugerbedømmelser af From Contamination to Defects, Faults and Yield Loss



Andre købte også..
Find lignende bøger
Bogen From Contamination to Defects, Faults and Yield Loss findes i følgende kategorier: