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From Contamination to Defects, Faults and Yield Loss

- Simulation and Applications

af Jitendra B. Khare, Wojciech Maly

indgår i Frontiers in Electronic Testing serien

From Contamination to Defects, Faults and Yield Loss af Jitendra B. Khare
Bag om From Contamination to Defects, Faults and Yield Loss

Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781461285953
  • Indbinding:
  • Paperback
  • Sideantal:
  • 150
  • Udgivet:
  • 26. september 2011
  • Udgave:
  • 11996
  • Størrelse:
  • 234x156x9 mm.
  • Vægt:
  • 272 g.
  • 8-11 hverdage.
  • 7. december 2024
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Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

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