From Contamination to Defects, Faults and Yield Loss
- Simulation and Applications
- Indbinding:
- Hardback
- Sideantal:
- 150
- Udgivet:
- 1. April 1996
- Udgave:
- 1996
- Størrelse:
- 234x156x11 mm.
- Vægt:
- 930 g.
Leveringstid:
8-11 hverdage
Forventet levering: 5. Oktober 2024
Beskrivelse af From Contamination to Defects, Faults and Yield Loss
Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.
Brugerbedømmelser af From Contamination to Defects, Faults and Yield Loss
Giv din bedømmelse
For at bedømme denne bog, skal du være logget ind.Andre købte også..
Find lignende bøger
Bogen From Contamination to Defects, Faults and Yield Loss findes i følgende kategorier:
© 2024 Pling BØGER Registered company number: DK43351621