Bøger af Said Hamdioui
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1.122,95 kr. - Bog
- 1.122,95 kr.
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- Defects, Fault Models and Test Patterns
1.168,95 kr. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.
- Bog
- 1.168,95 kr.