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  • af Said Hamdioui
    1.107,95 kr.

  • - Defects, Fault Models and Test Patterns
    af Said Hamdioui
    1.153,95 kr.

    Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.