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Electron Beam Testing Technology

indgår i Microdevices serien

Electron Beam Testing Technology
Bag om Electron Beam Testing Technology

Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781489915245
  • Indbinding:
  • Paperback
  • Sideantal:
  • 462
  • Udgivet:
  • 4. juni 2013
  • Udgave:
  • 11993
  • Størrelse:
  • 254x178x24 mm.
  • Vægt:
  • 905 g.
  • 8-11 hverdage.
  • 10. december 2024

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- Adgang til 70.000+ titler
- Ingen binding

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Ingen binding og kan opsiges når som helst.

Beskrivelse af Electron Beam Testing Technology

Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.

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