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Electromigration In Ulsi Interconnections

af Cher Ming (Ntu Tan

indgår i International Series On Advances In Solid State Electronics And Technology serien

Electromigration In Ulsi Interconnections af Cher Ming (Ntu Tan
Bag om Electromigration In Ulsi Interconnections

Presents a description of the electro migration in integrated circuits. This book examines the various interconnected systems and their evolution employed in integrated circuit technology. It is suitable for readers on electro migration in ULSI interconnections.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9789814273329
  • Indbinding:
  • Hardback
  • Sideantal:
  • 312
  • Udgivet:
  • 25. august 2010
  • Størrelse:
  • 229x155x23 mm.
  • 2-3 uger.
  • 11. december 2024

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Beskrivelse af Electromigration In Ulsi Interconnections

Presents a description of the electro migration in integrated circuits. This book examines the various interconnected systems and their evolution employed in integrated circuit technology. It is suitable for readers on electro migration in ULSI interconnections.

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