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Design, Analysis and Test of Logic Circuits Under Uncertainty

af John P. Hayes, Igor L. Markov, Smita Krishnaswamy

indgår i Lecture Notes in Electrical Engineering serien

Design, Analysis and Test of Logic Circuits Under Uncertainty af John P. Hayes
Bag om Design, Analysis and Test of Logic Circuits Under Uncertainty

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9789400797987
  • Indbinding:
  • Paperback
  • Sideantal:
  • 124
  • Udgivet:
  • 14. april 2014
  • Udgave:
  • 2013
  • Størrelse:
  • 235x155x7 mm.
  • Vægt:
  • 2175 g.
  • 8-11 hverdage.
  • 20. november 2024

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Beskrivelse af Design, Analysis and Test of Logic Circuits Under Uncertainty

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques.

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