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Defect and Microstructure Analysis by Diffraction

indgår i International Union of Crystallography Monographs on Crystallography serien

Defect and Microstructure Analysis by Diffraction
Bag om Defect and Microstructure Analysis by Diffraction

Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780198501893
  • Indbinding:
  • Hardback
  • Sideantal:
  • 808
  • Udgivet:
  • 6. januar 2000
  • Størrelse:
  • 164x238x49 mm.
  • Vægt:
  • 1292 g.
  • 2-4 uger.
  • 16. maj 2025
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Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction.

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