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Contactless VLSI Measurement and Testing Techniques

af Selahattin Sayil
Contactless VLSI Measurement and Testing Techniques af Selahattin Sayil
Bag om Contactless VLSI Measurement and Testing Techniques

The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783319888194
  • Indbinding:
  • Paperback
  • Sideantal:
  • 93
  • Udgivet:
  • 4. september 2018
  • Udgave:
  • 12018
  • Vægt:
  • 226 g.
  • 2-3 uger.
  • 30. november 2024
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The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.

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