De Aller-Bedste Bøger - over 12 mio. danske og engelske bøger
Levering: 1 - 2 hverdage
Hjælp
Login
  1. Forside
  2. Bøger
  3. Business og læring
  4. Computer og IT
  5. Contactless VLSI Measurement and Testing Techniques

Contactless VLSI Measurement and Testing Techniques

af Selahattin Sayil
Contactless VLSI Measurement and Testing Techniques af Selahattin Sayil
Bag om Contactless VLSI Measurement and Testing Techniques

The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9783319888194
  • Indbinding:
  • Paperback
  • Sideantal:
  • 93
  • Udgivet:
  • 4. September 2018
  • Udgave:
  • 12018
  • Vægt:
  • 226 g.
  • 2-3 uger.
  • 9. Oktober 2024
På lager

Normalpris

Abonnementspris

- Rabat på køb af fysiske bøger
- 1 valgfrit digitalt ugeblad
- 20 timers lytning og læsning
- Adgang til 70.000+ titler
- Ingen binding

Abonnementet koster 75 kr./md.
Ingen binding og kan opsiges når som helst.

Bag om Selahattin Sayil

Vis alle bøger af Selahattin Sayil

Beskrivelse af Contactless VLSI Measurement and Testing Techniques

The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.

Brugerbedømmelser af Contactless VLSI Measurement and Testing Techniques



Andre købte også..
Find lignende bøger
Bogen Contactless VLSI Measurement and Testing Techniques findes i følgende kategorier: