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CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

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CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155
Bag om CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781605111285
  • Indbinding:
  • Hardback
  • Sideantal:
  • 194
  • Udgivet:
  • 19. november 2009
  • Størrelse:
  • 160x236x14 mm.
  • Vægt:
  • 430 g.
Leveringstid: 8-11 hverdage
Forventet levering: 28. november 2024

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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