Characterisation and Control of Defects in Semiconductors

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This book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors.

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Sprog:
Engelsk

ISBN:
9781785616556

Forlag:
Institution of Engineering and Technology

Indbinding:
Hardback

Sideantal:
596

Udgivet:
16. december 2019

Leveringstid: 8-11 hverdage.
Forventet levering: 10. december 2024

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Beskrivelse af Characterisation and Control of Defects in Semiconductors

This book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors.

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