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Built-in-Self-Test and Digital Self-Calibration for RF SoCs

af Mohammed Ismail, Sleiman Bou-Sleiman

indgår i SpringerBriefs in Electrical and Computer Engineering serien

Built-in-Self-Test and Digital Self-Calibration for RF SoCs af Mohammed Ismail
Bag om Built-in-Self-Test and Digital Self-Calibration for RF SoCs

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781441995476
  • Indbinding:
  • Paperback
  • Sideantal:
  • 89
  • Udgivet:
  • 22. september 2011
  • Udgave:
  • 2012
  • Størrelse:
  • 234x156x5 mm.
  • Vægt:
  • 180 g.
  • 8-11 hverdage.
  • 26. november 2024

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Beskrivelse af Built-in-Self-Test and Digital Self-Calibration for RF SoCs

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).

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