Built-in-Self-Test and Digital Self-Calibration for RF SoCs
- Indbinding:
- Paperback
- Sideantal:
- 89
- Udgivet:
- 22. September 2011
- Udgave:
- 2012
- Størrelse:
- 234x156x5 mm.
- Vægt:
- 180 g.
Leveringstid:
8-11 hverdage
Forventet levering: 4. Oktober 2024
Beskrivelse af Built-in-Self-Test and Digital Self-Calibration for RF SoCs
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
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