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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

indgår i Methods of Surface Characterization serien

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
Bag om Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780306458965
  • Indbinding:
  • Hardback
  • Sideantal:
  • 430
  • Udgivet:
  • 1. oktober 1998
  • Udgave:
  • 2002
  • Størrelse:
  • 234x156x25 mm.
  • Vægt:
  • 1790 g.
  • 8-11 hverdage.
  • 2. december 2024

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The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

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