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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

af Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
Advanced Scanning Electron Microscopy and X-Ray Microanalysis af Patrick Echlin
Bag om Advanced Scanning Electron Microscopy and X-Ray Microanalysis

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781475790290
  • Indbinding:
  • Paperback
  • Sideantal:
  • 454
  • Udgivet:
  • 8. juni 2013
  • Udgave:
  • 11986
  • Størrelse:
  • 229x152x24 mm.
  • Vægt:
  • 692 g.
Leveringstid: 8-11 hverdage
Forventet levering: 21. november 2024

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Beskrivelse af Advanced Scanning Electron Microscopy and X-Ray Microanalysis

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.

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