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The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service.
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Rapid Reliability Assessment of VLSICs

af A.P. Dorey, B.K. Jones, A.M.D. Richardson & mfl.

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The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service.
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