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Bøger af Ullrich Pietsch

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  • - From Thin Films to Lateral Nanostructures
    af Vaclav Holy, Tilo Baumbach & Ulrich Pietsch
    999,95 - 1.446,95 kr.

    During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.