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  • From Contamination to Defects, Faults and Yield Loss af Jitendra B. Khare
    From Contamination to Defects, Faults and Yield Loss
    - Simulation and Applications
    af Jitendra B. Khare & Wojciech Maly
    1.090,95 kr.

    Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

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  • From Contamination to Defects, Faults and Yield Loss af Jitendra B. Khare
    From Contamination to Defects, Faults and Yield Loss
    - Simulation and Applications
    af Jitendra B. Khare & Wojciech Maly
    1.128,95 kr.

    Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

    Se mere