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  • - Characterization by Atomic Force Microscopy
    af K. C. Khulbe, Takeshi Matsuura & C. Y. Feng
    1.104,95 - 1.481,95 kr.

    Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM), which is fast becoming a very important tool.