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Advanced Test Methods for SRAMs

- Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

af Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Advanced Test Methods for SRAMs af Alberto Bosio
Bag om Advanced Test Methods for SRAMs

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781489983145
  • Indbinding:
  • Paperback
  • Sideantal:
  • 171
  • Udgivet:
  • 3. september 2014
  • Udgave:
  • 2010
  • Størrelse:
  • 235x155x10 mm.
  • Vægt:
  • 297 g.
  • 8-11 hverdage.
  • 6. december 2024

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- Adgang til 70.000+ titler
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Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies.

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